PORTABLE WAVEFRONT METROLOGY SYSTEM

PORTABLE WAVEFRONT METROLOGY SYSTEM

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Discover the Optical Engineer’s Companion (OEC) – a portable wavefront metrology system, available at LASER COMPONENTS.

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技术参数

交流 / 直流特性
Spatial ResolutionUp to 77×77 microlens array (measured in sub-apertures)
Wavefront Accuracyλ/100 RMS repeatability (at 633 nm)
环境与封装
Aperture SizeUp to 11 mm clear aperture
其他
Advanced Shack-Hartmann Sensor for Fast, Accurate AlignmentAt the heart of the OEC is a high-resolution Shack-Hartmann wavefront sensor offering λ/100 RMS repeatability and high dynamic range. It supports a wide range of wavelengths and configurations, with built-in analysis functions such as Zernike decomposition, MTF, PSF, and Strehl ratio calculations, it supports real-time measurement and alignment tasks. Whether used in R\&D, industrial inspection, or on-site testing, the OEC delivers precise, actionable metrology in a truly portable format.
Data InterfaceUSB 3.0 connection for fast data transfer
Dynamic RangeFrom -π to +π radians, enabling measurement of highly aberrated wavefronts
Form FactorCompact dimensions: ~150 × 100 × 60 mm, weight <1 kg
Measurement SpeedUp to 10 Hz real-time acquisition rate
Sensor TypeHigh-resolution Shack-Hartmann wavefront sensor
Wavelength RangeFrom 400 to 1100 nm, depending on model configuration
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技术资料