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Technical parameters

Key specs

Memory typeDRAM
Memory size4 Gbit
InterfaceParallel
Supply voltage75 mV ~ 1.5 VVDDQ = 1.35V (1.283V to 1.45V)
Clock frequency800 MHzMax

Datasheet-verified parameters

21 items
ParameterValue and test conditionsSource
Memory TypeLPDDR3 SDRAM
Density4G bits (256Mx16)
Interfacex16
Supply VoltageVDD, VDDQ = 1.35V (1.283V to 1.45V); Backward compatible to 1.5V ± 0.075V
Max Clock Frequency800 MHz
Package96-ball FBGA
Operating Case TemperatureCommercial: 0°C to +95°C
Temperature GradeCommercial
RoHS ComplianceLead-free (RoHS compliant)
Halogen FreeHalogen-free
Data Rate1600Mbps, 1866Mbps
Organization32M words x 16 bits x 8 banks
Page Size2KB
Burst Lengths8 and 4 with Burst Chop (BC)
CAS Latency (CL)5, 6, 7, 8, 9, 10, 11, 13
CAS Write Latency (CWL)5, 6, 7, 8, 9
Driver StrengthRZQ/7, RZQ/6 (RZQ = 240 Ω)
Refresh Cycles7.8 μs at -40°C ≤ Tc ≤ +85°C; 3.9 μs at +85°C < Tc ≤ +95°C
Absolute Maximum VoltageVDD, VDDQ, VIN, VOUT: -0.4 V ~ 1.975 V
Storage Temperature-55 to +150 °C
Recommended Operating VoltageVDD, VDDQ: Min 1.283V, Typ 1.35V, Max 1.45V (for 1.35V operation)
All parameters (19)ExpandCollapse
Power
Voltage - Supply1.283V ~ 1.45V
AC and DC characteristics
Clock Frequency800 MHz
Environment and package
Memory Size4Gbit
Mounting TypeSurface Mount
Operating Temperature0°C~95°C(TC)
PackageTray
Package / Case96-TFBGA
Supplier Device Package96-FBGA (13.5x9)
Other
Access Time20 ns
Base Product NumberAS4C256
Memory FormatDRAM
Memory InterfaceParallel
Memory Organization256M x 16
Memory TypeVolatile
MfrAlliance Memory, Inc.
Product StatusObsolete
Series-
TechnologySDRAM - DDR3L
Write Cycle Time - Word, Page15ns

Pinout and package

Package96-ball FBGA

PinNameFunctionSource
A0 - A14Address Inputs: Provided the row address for Active commands and the column address for Read / Write commands to select one location out of the memory array in the respective bank. (A10/AP and A12/BC have additional functions, see below) The address inputs also provide the op-code during Mode
A10 / APAutoprecharge: A10 is sampled during Read/Write commands to determine whether Autoprecharge should be performed to the accessed bank after the Read/Write operation. (HIGH:Autoprecharge; LOW: No Autoprecharge) A10 is sampled during a Precharge command to determine whether the Precharge applies to one
A12 / BC#Burst Chop: A12 is sampled during Read and Write commands to determine if burst chop(on-the-fly) will be performed. (HIGH: no burst chop, LOW: burst chopped). See command truth table for details.
BA0 - BA2Bank Address Inputs: BA0 - BA2 define to which bank an Active, Read, Write or Precharge command is being applied. Bank address also determines which mode register is to be accessed during a MRS cycle.
CK, CK#Clock: CK and CK# are differential clock inputs. All address and control input signals are sampled on the crossing of the positive edge of CK and negative edge of CK#. Output (read) data is referenced to the crossings of CK and CK#.
CKEClock Enable: CKE HIGH activates, and CKE Low deactivates, internal clock signals and device input buffers and output drivers. Taking CKE Low provides Precharge Power-Down and Self Refresh operation (all banks idle), or Active Power-Down (Row Active in any bank). CKE is asynchronous for self refresh
CS#Chip Select: All commands are masked when CS# is registered HIGH. CS# provides for external Rank selection on systems with multiple Ranks. CS# is considered part of the command code.
DM (DMU), (DML)Input Data Mask: DM is an input mask signal for write data. Input data is masked when DM is sampled HIGH coincident with that input data during a Write access. DM is sampled on both edges of DQS#.
DQData Input/ Output: Bi-directional data bus.
DQSL, DQSL# DQSU, DQData Strobe: Output with read data, input with write data. Edge-aligned with read data, centered in write data. For the x16, DQSL corresponds to the data on DQL0-DQL7; DQSU corresponds to the data on DQU0-DQU7. The data strobe DQSL and DQSU are paired with differential signals DQSL# and DQSU#, res
NCNo Connect: No internal electrical connection is present.
ODTOn Die Termination: ODT (registered HIGH) enables termination resistance internal to the DDR3 SDRAM. When enabled, ODT is only applied to each DQ, DQS, DQS# and DM/TDQS, NU/TDQS# (When TDQS is enabled via Mode Register A11=1 in MR1) signal for x8 configurations. The ODT pin will be ignored if the
RAS#, CAS#, WE#Command Inputs: RAS#, CAS# and WE# (along with CS#) define the command being entered.
RESET#Active Low Asynchronous Reset: Reset is active when RESET# is LOW, and inactive when RESET# is HIGH. RESET# must be HIGH during normal operation. RESET# is a CMOS rail to rail signal with DC high and low at 80% and 20% of VDD, i.e. 1.20V for DC high and 0.30V for DC low.
VDDPower Supply: 1.35V, 1.283 - 1.45V operational; compatible to 1.5+/- 0.075V operation.
VDDQDQpower supply: 1.35V, 1.283 - 1.45V operational; compatible to 1.5+/- 0.075V operation.
VREFCAReference Voltage for CA
VREFDQReference Voltage for DQ
VSSGround
VSSQDQGround
ZQReference Pin for ZQ calibration

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